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6TL36 In-line Test Handler w/bypass

PN: AM304 Categories: , , Tags: , ,

  • 6TL36 test handler able to test DUTs inside Faraday Chamber
  • Dual line (bypass) for feeding modules throw the modules with test in progress
  • Extremely low footprint per module: 800 x 1.500 x 1.800mm [WxDxH]
  • Expandable to form a group with up to 4 test modules (adaptable line depending on production volumes)
  • ICT, FCT, RF, ISP, Boundary Scan, LEDs, HiPot or combined technologies supported
  • Numerically controlled DUT stop (mechanical stopper-less system)
  • Fixture exchange time 3,2s
  • Max. PCB dimension 400 x 388mm (340 x 350mm for RF)
  • 19” rack space for instruments integration: 28 UH
  • Programming the tightening positions allows you to select active groups of test leads
  • Receiver 25 slots in probe plate + 4 slots in push plate
  • Automatic and synchronized width adjustment of line conveyors
  • High dynamics DUT transfer speed (1500 mm/s)
  • Component clearance: 90mm top and 30mm bottom
  • SMEMA and Hermes production line interface standards
  • All physical positions controlled by absolute encoders. No positions reset necessary
  • CE

Description

The 6TL36 test handler is the first ATE handler on the market that easily integrates the radio frequency tests into mass production lines.

The modular approach of the 6TL36 offers the possibility of adding handlers together for a work in parallel that reduces the cycle time and saves costs as well as space, when comparing to traditional parallel solutions. Therefore, the system can be ordered with only one conveyor, with two conveyors (bypass or dual-line) and with three conveyors (Retour conveyor).

The 6TL36 is the best production solution to test the products that feature the latest challenges set out by the IoT and the manufacturing of connected products.

Download the full brochure here: 6TL36 In-line Test Handler

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6TL36 user manual
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IPC-SMEMA-9851
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Additional information

Type

Production volume

Receiver Capacity

Maximum Dimensions PCB

UUT Contact

Max TP

,

Functional Test

Incircuit Test

Boundary Scan Test

RF Test

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