6TL36 In-line Test Handler w/bypass

PN: AM304 Category: Tags: , ,

  • Test handler 6TL36 able to test DUTs inside Faraday Chamber
  • Dual line (bypass)
  • 800 x 1.500 x 1.800mm [WxDxH]
  • Expandable to form a group with several 6TL36 modules (adapt line to production volumes).
  • ICT, FCT with RF, ISP or Combined test (ICT+FCT)
  • Servocontrolled DUT stop (stopper-less system)
  • Exchange time 3,2s
  • Max. PCB dimension 400x388mm (340x350mm for RF)
  • 19” rack space for instruments integration: 28UH
  • Receiver 25 slots in probe plate + 4 slots in push plate
  • Automatic Conveyor width adjustment
  • High dynamics conveyors (1500 mm/s)
  • 90mm Top-30mm Bottom Component clearance
  • SMEMA and Hermes standard
  • CE

Available on back-order

The 6TL36 test handler is the first ATE handler on the market that easily integrates the radio frequency tests into mass production lines.

The modular approach of the 6TL36 offers the possibility of adding handlers together for a work in parallel that reduces the cycle time and saves costs as well as space, when comparing to traditional parallel solutions. Therefore, the system can be ordered with only one conveyor, with two conveyors (bypass or dual-line) and with three conveyors (Retour conveyor).

The 6TL36 is the best production solution to test the products that feature the latest challenges set out by the IoT and the manufacturing of connected products.

Download the full brochure here: In-Line Test Handler

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Additional information


Production volume

Receiver Capacity

Maximum Dimensions PCB

UUT Contact

Max TP


Functional Test

Incircuit Test

Boundary Scan Test

RF Test

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